NXP & Memfault: Higher Quality, Better Performing IoT Devices with Embedded Observability Webinar
NXP and Memfault have collaborated to give IoT device manufacturers in-field device monitoring, crash reporting, and updating capabilities for faster product development, improved device operation, and reduced direct resource costs. Together, Memfault and NXP are helping IoT developers build smart cities, smart homes, IIoT, and automotive devices to save time and ease the worry of triaging and troubleshooting, allowing them to focus on building value-added features.