Balancing new feature development and improving what already exists
In this clip, Dave discusses how Latch balances what new features to develop while also considering how to improve what already exists.
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Memfault
LTE and IoT - How We Got Here
Cellular devices and networks have come a long way, from brick phones and Blackberrys to iPhones and Google Pixels. In addition to being the ubiquitous connectivity protocol that keeps the Internet at our fingertips at all times, LTE is appearing in IoT products across all industries.
Processing Log || Feature Highlight Video
In this video we take a look at the newly released Processing Log. The processing log is designed to give developers working with Memfault an extra level of visibility into any errors happening on the Memfault server side to help them more quickly debug any issues.
How well Latch sleeps at night having Memfault in place
Dave describes how he and his team feel after shipping a firmware update and having the data flow into Memfault. The quick summary: The Latch team sleeps quite well after shipping an update.
Accelerate development and optimize in-field device quality with remote debugging and monitoring
Ensuring high product quality & reliability extends beyond lab testing. Field conditions and ever-changing device ecosystems require continual adjustments for seamless connectivity, optimal battery life, and sustained interoperability. A robust pipeline to capture, analyze, and alert on device reliability data is critical to maximize yield, optimize performance, and stay ahead of problems that emerge in the field.
How Embedded Device Observability Helps Latch Build Ultra-Reliable Products
Embedded developers have historically found it difficult to obtain high-quality data on the performance and health of their devices once deployed in the field. They've had to rely on customer reports and navigate through complex and time-consuming processes to effectively address any issues that arise. For companies like Latch, who care deeply about product reliability and quality, this isn’t good enough. Find out how they use Memfault to collect high-quality debugging and performance data from their devices in the field and use it to ensure their customers get the best possible product.
Diving into JTAG - Overview (Part 1)
As the first segment of a three-part series on JTAG, this post will give an overview of JTAG to set up some more in-depth discussions on debugging and JTAG Boundary-Scan. We will dive into the intricacies of the interface, such as the Test Access Port (TAP), key registers, instructions, and JTAG’s finite state machine. Like Interrupt? Subscribe to get our latest posts straight to your inbox.
NXP + Memfault + Golioth: Bringing Observability and Device Management to IoT Devices
NXP, Golioth, and Memfault have collaborated to give IoT developers the same composable tooling that cloud developers are accustomed to with modern data architectures. With this partnership, NXP developers can leverage a single, secure connection for instant access to data routing, core dump analysis, and observability for rapid time-to-market and improved IoT device performance. In the webinar, our presenters cover.
Visualizing Real-time Data With STMViewer
If you’ve ever wanted to plot data acquired on your embedded target, this article is for you. It explores common use cases for real-time data visualization using STMViewer. Say goodbye to manual, time-consuming, and error-prone data collection and display methods to speed up your debugging process.
Configurable Dashboards || Memfault Feature Highlights
In this feature highlight we take a look at some of the functionality in our new configurable dashboards.